Organic matter is deposited and preserved under anoxic conditions. XRF Solutions uses several chemical indicators for distinguishing between oxidizing and reducing environments at the time of deposition. Portable XRF instruments cannot directly measure carbon, however the amount of organic carbon (TOC) can be estimated from the amounts of trace elements associated with organic material (Mn, V, U, Mo). Values predicted using the XRF Solutions algorithm can be compared to lab measured TOC for samples from the same intervals. Examples from a vertical and horizontal well are displayed in Figure A and Figure B from the Duvernay Formation.
Figure A. Redox and TOC Indicators from Core Analysis in the Duvernay Formation.
Figure B. Redox and TOC Indicators from Drill Cuttings Analysis in the Duvernay Formation.